Developed by AlphaCHIP universal and flexible architecture with standardized interface allows:

• reducing a test chip development time (2 … 4 months)
• reusing an auxiliary hardware (probe and load cards) and packages
• reducing test patterns development time

Developed by AlphaCHIP universal Built In Self Characterizers (BISC) allow accurate high resolution (~30 ps) measurement of the following timing parameters:

• Delay (access) time
• Setup and hold time
• Max clock frequency

Embedded thermo-stabilization system for precise high temperature (up to 200 C) testing

Functional and parametric testing:

• Memory Compilers
• Standard Cell Libraries
• IO Libraries